Summary of how to test UAC2 function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test UAC1 function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test SOURCESINK function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test SERIAL function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test RNDIS function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test PHONET function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test OBEX function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test NCM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test MIDI function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test MASS STORAGE function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test LOOPBACK function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test HID function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test FFS (FunctionFS) function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test EEM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test ECM subset function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Summary of how to test ECM function of USB gadget.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
The newly added file will be used to provide descriptions of how to test
the functions of USB gadgets.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Using module parameters to specify accepted Vendor ID, Product ID is
considered legacy now. Update the documentation to reflect it.
Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
dwc3_gadget_init_hw_endpoints calls dwc3_alloc_trb_pool only if epnum is not
equal to 0 or 1. Hence, rechecking it in the called function is redundant.
Signed-off-by: Amit Virdi <amit.virdi@st.com>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Removes some functions that are not used anywhere:
s3c2410_udc_clear_ep_state() s3c2410_udc_set_ep0_sse_out()
This was partially found by using a static code analysis program called cppcheck.
Signed-off-by: Rickard Strandqvist <rickard_strandqvist@spectrumdigital.se>
Signed-off-by: Felipe Balbi <balbi@ti.com>
Pull ARM fixes from Russell King:
"Three small fixes from over the Christmas period, and wiring up the
new execveat syscall for ARM"
* 'fixes' of git://ftp.arm.linux.org.uk/~rmk/linux-arm:
ARM: 8275/1: mm: fix PMD_SECT_RDONLY undeclared compile error
ARM: 8253/1: mm: use phys_addr_t type in map_lowmem() for kernel mem region
ARM: 8249/1: mm: dump: don't skip regions
ARM: wire up execveat syscall
Andrzej Pietrasiewicz
Amit Virdi
Mickael Maison
Rickard Strandqvist
Linus Torvalds