Also:
* common.h: Increase safety of some of the macros.
Parenthesizing the macro parameters ... a best practice.
* firmware: partially-tracked source of "extra bits" messages.
Add a TODO comment for further study.
* Improve reliability of `lf em 4x70 writekey`
Authenticate w/new key after it is written.
Particularly important for glass modules,
or other tags with weaker coupling.
- make tearoff_delay_us and tearoff_enabled globals
- use tearoff_hook and remove Dbprintf in critical tearoff timing
- move initial write from MifareU_Otp_Tearoff to CmdHF14AMfuOtpTearoff and make it optional (old behavior was writing initial 00000000 when -d was not provided)
- tearoff: compare with initial write, not with previous tearoff outcome
- rephrase some messages
- track all begin and end of erase and write phases, with quite complex logic to cover multiple cases (starting in middle of erased phase, starting with write 0, ...) and report them
- check against initial write error
- repeat same timing (up to 10x) in case of write/read errors then quit
- typos
iceman1001
Henry Gabryjelski
wh201906
Philippe Teuwen