Pull MTD update from David Woodhouse:
"Fairly unexciting MTD merge for 3.9:
- misc clean-ups in the MTD command-line partitioning parser
(cmdlinepart)
- add flash locking support for STmicro chips serial flash chips, as
well as for CFI command set 2 chips.
- new driver for the ELM error correction HW module found in various
TI chips, enable the OMAP NAND driver to use the ELM HW error
correction
- added number of new serial flash IDs
- various fixes and improvements in the gpmi NAND driver
- bcm47xx NAND driver improvements
- make the mtdpart module actually removable"
* tag 'for-linus-20130301' of git://git.infradead.org/linux-mtd: (45 commits)
mtd: map: BUG() in non handled cases
mtd: bcm47xxnflash: use pr_fmt for module prefix in messages
mtd: davinci_nand: Use managed resources
mtd: mtd_torturetest can cause stack overflows
mtd: physmap_of: Convert device allocation to managed devm_kzalloc()
mtd: at91: atmel_nand: for PMECC, add code to check the ONFI parameter ECC requirement.
mtd: atmel_nand: make pmecc-cap, pmecc-sector-size in dts is optional.
mtd: atmel_nand: avoid to report an error when lookup table offset is 0.
mtd: bcm47xxsflash: adjust names of bus-specific functions
mtd: bcm47xxpart: improve probing of nvram partition
mtd: bcm47xxpart: add support for other erase sizes
mtd: bcm47xxnflash: register this as normal driver
mtd: bcm47xxnflash: fix message
mtd: bcm47xxsflash: register this as normal driver
mtd: bcm47xxsflash: write number of written bytes
mtd: gpmi: add sanity check for the ECC
mtd: gpmi: set the Golois Field bit for mx6q's BCH
mtd: devices: elm: Removes <xx> literals in elm DT node
mtd: gpmi: fix a dereferencing freed memory error
mtd: fix the wrong timeo for panic_nand_wait()
...
mtd_torturetest uses the module parm "ebcnt" to control the size of a
stack based array of int's. When "ebcnt" is large, Ex: 1000, it
causes stack overflows on systems with small kernel stacks. The fix
is to move the array from the stack to kmalloc memory.
Signed-off-by: Al Cooper <alcooperx@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Use pr_info() and pr_err() while defining pr_fmt(). This saves a few
characters, joins a few lines, and makes the code a little more readable
(and grep-able).
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Vikram Narayanan <vikram186@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
This adds the double bit error detection test cases listed below:
* Prepare data block with double bit error and ECC data without
corruption, and verify that the uncorrectable error is detected by
__nand_correct_data().
* Prepare data block with single bit error and ECC data with single bit
error, and verify that the uncorrectable error is detected.
* Prepare data block without corruption and ECC data with double bit
error, and verify that the uncorrectable error is detected.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This adds the single bit error correction test case listed below:
Prepare data block without corruption and ECC data with single bit error,
and verify that the data block is preserved by __nand_correct_data().
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This adds no corruptin test case listed below:
Prepare data block and ECC data with no corruption, and verify that
the data block is preserved by __nand_correct_data()
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
This rewrites the entire test routine in order to make it easy to add more
tests by later changes and minimize duplication of each tests as much as
possible.
Now that each test is described by the members of struct nand_ecc_test:
- name: descriptive testname
- prepare: function to prepare data block and ecc with artifical corruption
- verify: function to verify the result of correcting data block
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
Currently inject_single_bit_error() is used to inject single bit error
into randomly selected bit position of the 256 or 512 bytes data block.
Later change will add tests which inject bit errors into the ecc code.
Unfortunately, inject_single_bit_error() doesn't work for the ecc code
which is not a multiple of sizeof(unsigned long).
Because bit fliping at random position is done by __change_bit().
For example, flipping bit position 0 by __change_bit(0, addr) modifies
3rd byte (32bit) or 7th byte (64bit) on big-endian systems.
Using little-endian version of bitops can fix this issue. But
little-endian version of __change_bit is not yet available.
So this defines __change_bit_le() locally in a similar fashion to
asm-generic/bitops/le.h and use it.
Signed-off-by: Akinobu Mita <akinobu.mita@gmail.com>
Signed-off-by: Artem Bityutskiy <artem.bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
