Pull MTD updates from Brian Norris:
"Summary:
- Add device tree support for DoC3
- SPI NOR:
Refactoring, for better layering between spi-nor.c and its
driver users (e.g., m25p80.c)
New flash device support
Support 6-byte ID strings
- NAND:
New NAND driver for Allwinner SoC's (sunxi)
GPMI NAND: add support for raw (no ECC) access, for testing
purposes
Add ATO manufacturer ID
A few odd driver fixes
- MTD tests:
Allow testers to compensate for OOB bitflips in oobtest
Fix a torturetest regression
- nandsim: Support longer ID byte strings
And more"
* tag 'for-linus-20141215' of git://git.infradead.org/linux-mtd: (63 commits)
mtd: tests: abort torturetest on erase errors
mtd: physmap_of: fix potential NULL dereference
mtd: spi-nor: allow NULL as chip name and try to auto detect it
mtd: nand: gpmi: add raw oob access functions
mtd: nand: gpmi: add proper raw access support
mtd: nand: gpmi: add gpmi_copy_bits function
mtd: spi-nor: factor out write_enable() for erase commands
mtd: spi-nor: add support for s25fl128s
mtd: spi-nor: remove the jedec_id/ext_id
mtd: spi-nor: add id/id_len for flash_info{}
mtd: nand: correct the comment of function nand_block_isreserved()
jffs2: Drop bogus if in comment
mtd: atmel_nand: replace memcpy32_toio/memcpy32_fromio with memcpy
mtd: cafe_nand: drop duplicate .write_page implementation
mtd: m25p80: Add support for serial flash Spansion S25FL132K
MTD: m25p80: fix inconsistency in m25p_ids compared to spi_nor_ids
mtd: spi-nor: improve wait-till-ready timeout loop
mtd: delete unnecessary checks before two function calls
mtd: nand: omap: Fix NAND enumeration on 3430 LDP
mtd: nand: add ATO manufacturer info
...
Pull driver core update from Greg KH:
"Here's the set of driver core patches for 3.19-rc1.
They are dominated by the removal of the .owner field in platform
drivers. They touch a lot of files, but they are "simple" changes,
just removing a line in a structure.
Other than that, a few minor driver core and debugfs changes. There
are some ath9k patches coming in through this tree that have been
acked by the wireless maintainers as they relied on the debugfs
changes.
Everything has been in linux-next for a while"
* tag 'driver-core-3.19-rc1' of git://git.kernel.org/pub/scm/linux/kernel/git/gregkh/driver-core: (324 commits)
Revert "ath: ath9k: use debugfs_create_devm_seqfile() helper for seq_file entries"
fs: debugfs: add forward declaration for struct device type
firmware class: Deletion of an unnecessary check before the function call "vunmap"
firmware loader: fix hung task warning dump
devcoredump: provide a one-way disable function
device: Add dev_<level>_once variants
ath: ath9k: use debugfs_create_devm_seqfile() helper for seq_file entries
ath: use seq_file api for ath9k debugfs files
debugfs: add helper function to create device related seq_file
drivers/base: cacheinfo: remove noisy error boot message
Revert "core: platform: add warning if driver has no owner"
drivers: base: support cpu cache information interface to userspace via sysfs
drivers: base: add cpu_device_create to support per-cpu devices
topology: replace custom attribute macros with standard DEVICE_ATTR*
cpumask: factor out show_cpumap into separate helper function
driver core: Fix unbalanced device reference in drivers_probe
driver core: fix race with userland in device_add()
sysfs/kernfs: make read requests on pre-alloc files use the buffer.
sysfs/kernfs: allow attributes to request write buffer be pre-allocated.
fs: sysfs: return EGBIG on write if offset is larger than file size
...
The torture test should quit once it actually induces an error in the
flash. This step was accidentally removed during refactoring.
Without this fix, the torturetest just continues infinitely, or until
the maximum cycle count is reached. e.g.:
...
[ 7619.218171] mtd_test: error -5 while erasing EB 100
[ 7619.297981] mtd_test: error -5 while erasing EB 100
[ 7619.377953] mtd_test: error -5 while erasing EB 100
[ 7619.457998] mtd_test: error -5 while erasing EB 100
[ 7619.537990] mtd_test: error -5 while erasing EB 100
...
Fixes: 6cf78358c9 ("mtd: mtd_torturetest: use mtd_test helpers")
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Cc: Akinobu Mita <akinobu.mita@gmail.com>
Cc: <stable@vger.kernel.org>
On device remove, when testing the cmtd field of an of_flash
struct to decide whether it is a concatenated device or not,
we get a false positive on cmtd == NULL, and dereference it
subsequently. This may occur if of_flash_remove() is called
from the cleanup path of of_flash_probe().
Instead, test for NULL first, and only then perform the test
for a concatenated device.
Signed-off-by: Ard Biesheuvel <ard.biesheuvel@linaro.org>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
This will allow spi-nor users to plainly use JEDEC to detect flash chip.
Signed-off-by: Rafał Miłecki <zajec5@gmail.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Several MTD users (either in user or kernel space) expect a valid raw
access support to NAND chip devices.
This is particularly true for testing tools which are often touching the
data stored in a NAND chip in raw mode to artificially generate errors.
The GPMI drivers do not implemenent raw access functions, and thus rely on
default HW_ECC scheme implementation.
The default implementation consider the data and OOB area as properly
separated in their respective NAND section, which is not true for the GPMI
controller.
In this driver/controller some OOB data are stored at the beginning of the
NAND data area (these data are called metadata in the driver), then ECC
bytes are interleaved with data chunk (which is similar to the
HW_ECC_SYNDROME scheme), and eventually the remaining bytes are used as
OOB data.
Signed-off-by: Boris Brezillon <boris.brezillon@free-electrons.com>
Tested-by: Huang Shijie <shijie8@gmail.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Add a new function to copy bits (not bytes) from a memory region to
another one.
This function is similar to memcpy except it acts at bit level.
It is needed to implement GPMI raw access functions and adapt to the
hardware ECC engine which does not pad ECC bits to the next byte boundary.
Signed-off-by: Boris Brezillon <boris.brezillon@free-electrons.com>
Tested-by: Huang Shijie <shijie8@gmail.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
write_enable() was being duplicated to both m25p80.c and fsl-quadspi.c.
But this should be handled within the spi-nor abstraction layer.
At the same time, let's add write_disable() after erasing, so we don't
leave the flash in a write-enabled state afterward.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Acked-by: Huang Shijie <shijie.huang@intel.com>
We need to store the six bytes ID for s25fl128s, since it shares the same
five bytes with s25fl129p1.
This patch adds a macro INFO6 which is used for the six bytes ID flash, and adds
a new item for the s25fl128s.
Signed-off-by: Huang Shijie <shijie.huang@intel.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
The "id" array contains all the information about the JEDEC and the
manufacturer ID info. This patch removes the jedec_id/ext_id from
flash_info.
Signed-off-by: Huang Shijie <shijie.huang@intel.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
This patch adds the id/id_len fields for flash_info{}, and rewrite the
INFO to fill them. And at last, we read out 6 bytes in the spi_nor_read_id(),
and we use these new fields to parse out the correct flash_info.
Signed-off-by: Huang Shijie <shijie.huang@intel.com>
Signed-off-by: Rafał Miłecki <zajec5@gmail.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
There is no need to use memcpy32_toio/memcpy32_fromio to transfer data
between memory and NFC sram. As the NFC sram is a also a memory space
not an I/O space, we can just use memcpy().
We remove the __iomem prefix for NFC sram to avoid sparse warnings.
Signed-off-by: Josh Wu <josh.wu@atmel.com>
Reviewed-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
This write_page() function is functionally equivalent to the default in
nand_base.c. Its only difference is in subpage programming support,
which cafe_nand.c does not advertise, so the difference is negligible.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
As stated in a5b7616c5, "mtd: m25p80,spi-nor: Fix module aliases for
m25p80", m25p_ids[] in m25p80.c needs to be kept in sync with
spi_nor_ids[] in spi-nor.c. The change here corrects a misalignment.
(We were missing m25px80 and we had a duplicate w25q128.)
Signed-off-by: Alison Chaiken <alison_chaiken@mentor.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Cc: <stable@vger.kernel.org> # 3.18+
There are a few small issues with the timeout loop in
spi_nor_wait_till_ready():
* The first operation should not be a reschedule; we should check the
status register at least once to see if we're complete!
* We should check the status register one last time after declaring the
deadline has passed, to prevent a premature timeout error (this is
theoretically possible if we sleep for a long time after the previous
status register check).
* Add an error message, so it's obvious if we ever hit a timeout.
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Acked-by: Huang Shijie <shijie.huang@intel.com>
Reviewed-by: Ezequiel Garcia <ezequiel@vanguardiasur.com.ar>
The functions kfree() and pci_dev_put() test whether their argument is NULL
and then return immediately. Thus the test around the call is not needed.
This issue was detected by using the Coccinelle software.
Signed-off-by: Markus Elfring <elfring@users.sourceforge.net>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
3430LDP has NAND flash with 32 bytes OOB size which is sufficient to hold
BCH8 codes but the small page check introduced in
commit b491da7233 ("mtd: nand: omap: clean-up ecc layout for BCH ecc schemes")
considers anything below 64 bytes unsuitable for BCH4/8/16. There is another
bug in that code where it doesn't skip the check for OMAP_ECC_HAM1_CODE_SW.
Get rid of that small page check code as it is insufficient and redundant
because we are checking for OOB available bytes vs ecc layout before calling
nand_scan_tail().
Fixes: b491da7233 ("mtd: nand: omap: clean-up ecc layout for BCH ecc schemes")
Reported-by: Tony Lindgren <tony@atomide.com>
Signed-off-by: Roger Quadros <rogerq@ti.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Fixes warning:
drivers/mtd/tests/oobtest.c: In function 'memcmpshow':
drivers/mtd/tests/oobtest.c:129: warning: format '%x' expects type 'unsigned int', but argument 3 has type 'size_t'
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Cc: Roger Quadros <rogerq@ti.com>
Cc: Sekhar Nori <nsekhar@ti.com>
It is common for NAND devices to have bitflip errors.
Add a bitflip_limit parameter to specify how many bitflips per
page we can tolerate without flagging an error.
By default zero bitflips are tolerated.
Signed-off-by: Roger Quadros <rogerq@ti.com>
Signed-off-by: Sekhar Nori <nsekhar@ti.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Add a function memcmpshow() that compares the 2 data buffers
and shows the address:offset and data bytes on comparison failure.
This function does not break at a comparison failure but runs the
check for the whole data buffer.
Use memcmpshow() instead of memcmp() for all the verification paths.
Signed-off-by: Roger Quadros <rogerq@ti.com>
Signed-off-by: Sekhar Nori <nsekhar@ti.com>
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
