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Controlled EIO from the device is achieved using the dm device. Helper functions are at common/dmerror. Broadly steps will include calling _dmerror_init(). _dmerror_init() will use SCRATCH_DEV to create dm linear device and assign DMERROR_DEV to /dev/mapper/error-test. When test script is ready to get EIO, the test cases can call _dmerror_load_table() which then it will load the dm error. so that reading DMERROR_DEV will cause EIO. After the test case is complete, cleanup must be done by calling _dmerror_cleanup(). Signed-off-by: Anand Jain <anand.jain@oracle.com> Reviewed-by: Filipe Manana <fdmanana@suse.com> Reviewed-by: Dave Chinner <dchinner@redhat.com> Signed-off-by: Dave Chinner <david@fromorbit.com>