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apfstests/tests/generic/338.out
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Eryu Guan d00a869c2e generic: test I/O on dm error device
This is a test that performs simple I/O on dm error device, which
returns EIO on all I/O request.

This is motivated by an ext4 bug that crashes kernel on error path when
trying to update atime. Following kernel patch should fix the issue

  ext4: fix NULL pointer dereference in ext4_mark_inode_dirty()

Signed-off-by: Eryu Guan <eguan@redhat.com>
Reviewed-by: Dave Chinner <dchinner@redhat.com>
Signed-off-by: Dave Chinner <david@fromorbit.com>
2016-03-23 17:39:11 +11:00

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QA output created by 338
Silence is golden