generic: test dm-thin running out of data space vs concurrent discard

mirror of https://github.com/linux-apfs/apfstests.git synced 2026-05-01 15:01:44 -07:00

If a user constructs a test that loops repeatedly over below steps
on dm-thin, block allocation can fail due to discards not having
completed yet (Fixed by a685557 dm thin: handle running out of data
space vs concurrent discard):

1) fill thin device via filesystem file
2) remove file
3) fstrim

And this maybe cause a deadlock (fast device likes ramdisk can help
a lot) when racing a fstrim with a filesystem (XFS) shutdown. (Fixed
by 8c81dd46ef3c Force log to disk before reading the AGF during a
fstrim)

This case can reproduce both two bugs if they're not fixed. If only
the dm-thin bug is fixed, then the test will pass. If only the fs
bug is fixed, then the test will fail. If both of bugs aren't fixed,
the test will hang.

Signed-off-by: Zorro Lang <zlang@redhat.com>
Reviewed-by: Eryu Guan <guaneryu@gmail.com>
Signed-off-by: Eryu Guan <guaneryu@gmail.com>

This commit is contained in:

Zorro Lang

2018-07-12 13:08:50 +08:00

committed by

Eryu Guan

parent 94fa25ded8

commit 2c14233d91

3 changed files with 95 additions and 0 deletions

tests/generic/group

View File

@@ -502,3 +502,4 @@
 auto quick swap collapse
 auto quick log
 auto quick rw collapse zero
 auto thin trim