apfstests/tests/generic/124

#! /bin/bash
# SPDX-License-Identifier: GPL-2.0
# Copyright (c) 2006 Silicon Graphics, Inc.  All Rights Reserved.
#
# FSQA Test No. 124
#
# Test preallocated_rw_pattern_test modified from CXFSQA test preallocated_rw_pattern_test
#
# pat stands for pattern.  First 8 bytes contains the 64-bit number 0,
# second is 1, ..., until last 8 bytes (1048568-1048575) contain 131071.
# patw preallocates the file and then writes the pattern, patr checks it
#
seq=`basename $0`
seqres=$RESULT_DIR/$seq
echo "QA output created by $seq"

here=`pwd`
tmp=/tmp/$$
status=1	# failure is the default!
trap "_cleanup; exit \$status" 0 1 2 3 15

_cleanup()
{
    cd /
}

# get standard environment, filters and checks
. ./common/rc
. ./common/filter

# real QA test starts here
_supported_fs generic
_supported_os Linux

_require_test
_require_scratch
_scratch_mkfs >/dev/null 2>&1
_scratch_mount

# Run preallo_rw_pattern on both test and scratch partitions
for TESTFILE in $TEST_DIR/rw_pattern.tmp $SCRATCH_MNT/rw_pattern.tmp
  do
  count=1
  while (( count < 101 ))
    do
    $here/src/preallo_rw_pattern_writer $TESTFILE
    $here/src/preallo_rw_pattern_reader $TESTFILE
    if (test $? -ne 0) then
	echo Read/Write Pattern Test FAILED.
	_cleanup
	exit 1
    fi
    rm $TESTFILE
    ((count=count+1))
  done #done for count of  100
done

if (test $? -eq 0 ) then
    status=0
fi

_scratch_unmount

exit